# Appendix A. BD/McCrary Bin-Width Sensitivity (Signature Level) The main text (Section III-I, Section IV-D.2) treats the Burgstahler-Dichev / McCrary discontinuity procedure [38], [39] as a *density-smoothness diagnostic* rather than as a threshold estimator. This appendix documents the empirical basis for that framing by sweeping the bin width across four (variant, bin-width) panels: Firm A and full-sample, each in the cosine and $\text{dHash}_\text{indep}$ direction. Two patterns are visible in Table A.I. First, the procedure consistently identifies a "transition" under every bin width, but the *location* of that transition drifts monotonically with bin width (Firm A cosine: 0.987 → 0.985 → 0.980 → 0.975 as bin width grows from 0.003 to 0.015; full-sample dHash: 2 → 10 → 9 as the bin width grows from 1 to 3). The $Z$ statistics also inflate superlinearly with the bin width (Firm A cosine $|Z|$ rises from $\sim 9$ at bin 0.003 to $\sim 106$ at bin 0.015) because wider bins aggregate more mass per bin and therefore shrink the per-bin standard error on a very large sample. Both features are characteristic of a histogram-resolution artifact rather than of a genuine density discontinuity. Second, the candidate transitions all locate *inside* the non-hand-signed mode (cosine $\geq 0.975$, dHash $\leq 10$) rather than between modes, which is the location pattern we would expect of a clean two-mechanism boundary. Taken together, Table A.I shows that the signature-level BD/McCrary transitions are not a threshold in the usual sense---they are histogram-resolution-dependent local density anomalies located *inside* the non-hand-signed mode rather than between modes. This observation supports the main-text decision to use BD/McCrary as a density-smoothness diagnostic rather than as a threshold estimator and reinforces the joint reading of Section IV-D that per-signature similarity does not form a clean two-mechanism mixture. Raw per-bin $Z$ sequences and $p$-values for every (variant, bin-width) panel are available in the supplementary materials.